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| LEADER |
01059cam a22002531 4500 |
| 001 |
16357 |
| 008 |
970916s1997 enk 00100 eng |
| 020 |
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|a eng
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| 049 |
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|a TR7VH
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| 050 |
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|a QD96.S43
|b SEC 1997
|
| 111 |
2 |
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|a International Conference on Secondary Ion Mass Spectometry
|b (10.:
|c Muenster:
|d 1995)
|9 145434
|
| 245 |
1 |
0 |
|a Secondary ion mass spectrometry (Sims x):
|b Proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry, Universty of Muenster, Muenster, Germany, October 1-6th, 1995/
|c Ed.A.Benninghoven, B.Hagenhoff, H.W.Werner.
|
| 260 |
|
|
|a Chichester:
|b John Wiley,
|c 1997.
|
| 300 |
|
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|a 1057 s.;
|c 24 cm.
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| 500 |
|
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|a Dizin var.
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| 504 |
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|a Bibliyografya var.
|
| 700 |
1 |
|
|a Benninghoven, A.
|9 145435
|
| 700 |
1 |
|
|a Hagenhoff, B.
|9 145436
|
| 700 |
1 |
|
|a Werner, H.W.
|9 145437
|
| 942 |
|
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|2 lcc
|
| 999 |
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|c 14079
|d 14079
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| 952 |
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|6 QD0096 S43 SEC 01997
|7 0
|9 22777
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|d 1997-09-29
|e S
|g 999999.99
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|o QD96.S43 SEC 1997
|p 0015761
|r 2016-12-10
|w 1997-09-29
|y KT
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