Description: Secondary ion mass spectrometry (Sims x):

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Secondary ion mass spectrometry (Sims x): Proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry, Universty of Muenster, Muenster, Germany, October 1-6th, 1995/

Bibliographic Details
Corporate Author:	International Conference on Secondary Ion Mass Spectometry (10.: Muenster:
Other Authors:	Benninghoven, A., Hagenhoff, B., Werner, H.W.
Format:	Book
Language:	English
Published:	Chichester: John Wiley, 1997.

Description
Item Description:	Dizin var.
Physical Description:	1057 s.; 24 cm.
Bibliography:	Bibliyografya var.
ISBN:	0471958972