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00950cam a22002651 4500 |
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56884 |
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080331s2001 nyu 00100 eng |
| 020 |
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|a 0824705068
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| 040 |
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|a TRMEMSKU
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|a eng
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| 049 |
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|a TR7VH
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| 050 |
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|a TK7871.85
|b HAN 2001
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| 700 |
1 |
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|a Diebold, A. C.
|q (Alain C.)
|9 215346
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| 245 |
0 |
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|a Handbook of silicon semiconductor metrology /
|c ed. Alain C. Diebold.
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| 260 |
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|a New York :
|b Marcel Dekker,
|c 2001.
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| 300 |
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|a xvi, 874 s. :
|b res. ;
|c 27 cm.
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| 504 |
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|a Bibliyografya ve dizin var.
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| 650 |
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0 |
|a Semiconductors
|x Measurement.
|9 215347
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| 650 |
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0 |
|a Semiconductors
|x Inspection.
|9 215348
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| 650 |
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4 |
|a Yarı iletkenler
|x Ölçümler.
|9 215349
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| 650 |
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4 |
|a Yarı iletkenler
|x Teftiş.
|9 215350
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| 910 |
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|a 2550702010607076608
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| 942 |
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|2 lcc
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|c 50256
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|6 TK787185 H A N2001
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|a MK
|b MK
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|d 2008-03-31
|e S
|o TK7871.85 HAN 2001
|p 0090648
|r 2016-12-10
|t 1
|w 2008-03-31
|y KT
|