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01063cam a22003011 4500 |
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51620 |
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971216s1998 nyua b 001 0 eng |
020 |
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|a 0471241393 (cloth : alk. paper)
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020 |
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|a 9780471241393 (cloth : alk. paper)
|
040 |
|
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|a TRMEMSKU
|
049 |
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|a TR7VH
|
050 |
0 |
0 |
|a QC611
|b SCH 1998
|
082 |
0 |
0 |
|a 621.3815/2
|2 21
|
100 |
1 |
|
|a Schroder, Dieter K.
|9 205894
|
245 |
0 |
0 |
|a Semiconductor material and device characterization /
|c Dieter K. Schroder.
|
250 |
|
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|a 2. bs.
|
260 |
|
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|a New York :
|b Wiley,
|c 1998.
|
300 |
|
|
|a xxiv, 760 s. :
|b res. ;
|c 25 cm.
|
500 |
|
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|a "A Wiley-Interscience publication."
|
504 |
|
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|a Bibliyografya ve dizin var.
|
650 |
|
0 |
|a Semiconductors.
|9 38073
|
650 |
|
0 |
|a Semiconductors
|x Testing.
|9 205895
|
650 |
|
4 |
|a Yarı iletkenler
|9 149429
|
650 |
|
4 |
|a Yarı iletkenler
|x Test etme.
|9 205896
|
994 |
|
|
|a C0
|b TR7VH
|
942 |
|
|
|2 lcc
|
999 |
|
|
|c 44050
|d 44050
|
952 |
|
|
|0 0
|1 0
|2 lcc
|4 0
|5 0
|6 QC0611 S C H1998
|7 0
|9 65665
|a MK
|b MK
|c MK
|d 2007-06-11
|e S
|l 8
|o QC611 SCH 1998
|p 0085779
|r 2019-03-19
|s 2019-02-18
|t 1
|w 2007-06-11
|y KT
|