Schroder, D. K. (1998). Semiconductor material and device characterization (2. bs.). New York: Wiley.
Chicago Stili AlıntıSchroder, Dieter K. Semiconductor Material and Device Characterization. 2. bs. New York: Wiley, 1998.
MLA AlıntıSchroder, Dieter K. Semiconductor Material and Device Characterization. 2. bs. New York: Wiley, 1998.
Uyarı: Bu alıntı herzaman %100 doğru olmayabilir..