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| LEADER |
00968cam a22002651 4500 |
| 001 |
27274 |
| 008 |
020116s2000 ne 00100 eng |
| 020 |
|
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|a 030646487X
|
| 040 |
|
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|a TRMEMSKU
|
| 049 |
|
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|a TR7VH
|
| 050 |
0 |
0 |
|a TA417.23
|b ELE 2000
|
| 700 |
1 |
|
|a Schwartz,Adam J.,ed.
|9 159344
|
| 700 |
1 |
|
|a Kumar,Mukul,ed.
|9 159345
|
| 700 |
1 |
|
|a Adams,Brent L.,ed.
|9 159346
|
| 245 |
0 |
0 |
|a Electron backscatter diffraction in materials science/
|c Adam J. Schwartz,Mukukl Kumar,Brent L. Adams.
|
| 260 |
|
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|a Dordrecht:
|b Kluwer Academic,
|c 2000.
|
| 300 |
|
|
|a 339 s.;
|c 24 cm.
|
| 500 |
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|a Dizin var.
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| 504 |
|
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|a Bibliyografya var.
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| 650 |
|
4 |
|a MALZEMELER-MİKROSKOPİ
|9 158642
|
| 650 |
|
4 |
|a TARATICI ELEKTRON MİKROSKOPİSİ
|9 159347
|
| 650 |
|
4 |
|a KRİSTALLOGRAFİ
|9 144082
|
| 942 |
|
|
|2 lcc
|
| 999 |
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|c 23134
|d 23134
|
| 952 |
|
|
|0 0
|1 0
|2 lcc
|4 0
|5 0
|6 TA041723 E L E2000
|7 0
|9 37007
|a MK
|b MK
|c MK
|d 2001-12-21
|e S
|g 999999.99
|l 3
|m 1
|o TA417.23 ELE 2000
|p 0045858
|r 2017-04-26
|s 2017-03-27
|w 2001-12-21
|y KT
|