Skip to content
Toggle navigation
VuFind
Language
English
Deutsch
Türkçe
Русский
اللغة العربية
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Tag
Find
Advanced
Optical characterization of ep...
Holdings
Cite this
Email this
Export Record
Export to RefWorks
Export to EndNoteWeb
Export to EndNote
Optical characterization of epitaxial semiconductor layers/
Bibliographic Details
Other Authors:
Bauer,Günther,ed.
,
Richter,Wolfgang,ed.
Format:
Book
Language:
English
Published:
Berlin:
Springer,
1996.
Subjects:
EPİTAKSİ
KRİSTAL GELİŞMESİ
YARI İLETKENLER
Holdings
Description
Similar Items
Staff View
Menteşe Kütüphanesi
Holdings details from Menteşe Kütüphanesi
Call Number:
QC611.O6 OPT 1996
Copy
Available
Similar Items
Semiconductor physics.
by: Seeger, K.
Published: (1997)
Optical characterization of semiconductors/
Published: (1992)
Semiconductor physics and applications/
by: Balkanski, Minko
Published: (2000)
An Introduction to the physics of semiconductor devices/
Published: (1999)
GeSi strained layers and their applications/
Published: (1995)
×
Loading...