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| LEADER |
00876cam a22002531 4500 |
| 001 |
27309 |
| 008 |
020116s1996 gw 00100 eng |
| 020 |
|
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|a 354059129X
|
| 040 |
|
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|a TRMEMSKU
|
| 049 |
|
|
|a TR7VH
|
| 050 |
0 |
0 |
|a QC611.O6
|b OPT 1996
|
| 245 |
0 |
0 |
|a Optical characterization of epitaxial semiconductor layers/
|c Ed. Günther Bauer,Wolfgang Richter.
|
| 700 |
1 |
|
|a Bauer,Günther,ed.
|9 159744
|
| 700 |
1 |
|
|a Richter,Wolfgang,ed.
|9 159745
|
| 260 |
|
|
|a Berlin:
|b Springer,
|c 1996.
|
| 300 |
|
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|a 429 s.;
|c 24 cm.
|
| 500 |
|
|
|a Dizin var.
|
| 504 |
|
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|a Bibliyografya var.
|
| 650 |
|
4 |
|a EPİTAKSİ
|9 159746
|
| 650 |
|
4 |
|a KRİSTAL GELİŞMESİ
|9 159747
|
| 650 |
|
4 |
|a YARI İLETKENLER
|9 144256
|
| 942 |
|
|
|2 lcc
|
| 999 |
|
|
|c 22929
|d 22929
|
| 952 |
|
|
|0 0
|1 0
|2 lcc
|4 0
|5 0
|6 QC0611 O6 OPT 01996
|7 0
|9 36719
|a MK
|b MK
|c MK
|d 2001-12-21
|e S
|g 999999.99
|l 2
|o QC611.O6 OPT 1996
|p 0045790
|r 2016-12-10
|w 2001-12-21
|y KT
|