Epitaxy of semiconductor layered structures : symposium held November 30-December 4, 1987, Boston, Massachusetts, U.S.A. /
Соавтор: | Materials Research Society. |
---|---|
Другие авторы: | Tung, R. T., Dawson, L. R., Gunshor, Robert L. |
Формат: | |
Язык: | English |
Опубликовано: |
Pittsburgh, Pa. :
Materials Research Society,
c1988.
|
Серии: | Materials Research Society symposia proceedings ;
v. 102. |
Предметы: |
Схожие документы
-
Optical characterization of epitaxial semiconductor layers/
Опубликовано: (1996) -
Layered structures and interface kinetics : their technology and applications /
Опубликовано: (1985) -
Handbook on semiconductors: Optical properties of semiconductors /
Опубликовано: (1994) -
Semiconductor characterization: present status and future needs/
Опубликовано: (1996) -
Physiscs of semiconductor devices.
по: Sze, S.M.
Опубликовано: (1981)